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File: 1779160420308.jpg (13.64 KB, 1170x780, img_1779160412018_51kevrvr.jpg)ImgOps Exif Google Yandex

8d5d5 No.1666

i was curious how measurement_uncertainty_mcp rly works so i ran a quick test on some linewidth data from my recent experiments. here's the query and output for anyone else interested:
>query:
measured twenty times, each time at around 45nmresult sequence (in nanometers): [45.12], [45.08],[45.15],...


the server returns a detailed breakdown of the uncertainty - pretty cool! anyone tried this out w/ their own data?

https://dev.to/kyb8801/what-an-mcp-server-for-measurement-uncertainty-actually-returns-a-cd-sem-45-nm-worked-example-2pbh

8d5d5 No.1667

File: 1779161486633.jpg (209.63 KB, 1280x960, img_1779161472817_umf0inoh.jpg)ImgOps Exif Google Yandex

>>1666
ive used similar uncertainty analysis tools in my work, and its always helpful to see how different factors contribute! have u noticed any patterns in why there might be slight variations around 45nm?
display: flex

8d5d5 No.1678

File: 1779327155182.jpg (297.03 KB, 1080x720, img_1779327140587_9sx4hmra.jpg)ImgOps Exif Google Yandex

ive used measurement_uncertainty_mcp b4 for similar linewidth data and found it super helpful! have you tried plotting a histogram of those results to visualize their distribution? might give some additional insights.

edit: i was wrong nope i was right



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